Product features;
■ Multi point non-contact measurement with high accuracy;
Non contact detection, to avoid damage to the workpiece surface.
■ Wide range of detection, high dimensional limit;
Curvity R range: > 10mm
■ Suitable for on-line inspection;
The communication interface can be used to realize on-line detection with automatic equipment.
■ The result can guide the processing;
According to the distribution of the surface quality of the lens, the processing instructions are given.
■ Easy to use interface;
One time setting parameter can be detected by one key, and no standard lenses are needed for comparison, and non-contact testing of various curved lenses can be directly carried out.
Detection range;mainly used in lenses, reflective continuous surface, glass and other surface curvity radius, surface detection. The general purpose equipment is mainly aimed at detecting small size lens products of 3-30mm.
■Material can be detected in ordinary glass, silicon wafers, silicon carbide and other surface with mirror effect.
■Surface may include planar, spherical, cylindrical, aspheric, 2 off-axis, off-axis, free-form surfaces, etc.
■The curvity ranges from 10mm to tens of meters. In the figure below, the left curvity is 42.10mm, and the right curvity is 28.298m.
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Standard Type SHF-GMA |
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Serial Name |
SHF-GMA1 |
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Function |
Curvity Radius Detection |
● |
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Surface 3D Distribution |
□ |
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Auxiliary Machining Function |
□ |
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One Key Measuring Function |
● |
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Two-way Adjustment Platform |
● |
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Testing |
Plane |
● |
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Sphere |
● |
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Aspheric Surface |
□ |
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Hyperboloid |
□ |
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Paraboloid |
□ |
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Free-form Surface |
□ |
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Research Module |
□ |
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Testing |
Measuring Radius Of Curvaty，mm |
R＞50 |
50＞R＞10 |
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Lens Size，mm |
3—30 |
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Corresponding Plane Size，mm |
3—20 |
Measuring Area Diameter R*0.35 |
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Reflectivity |
≥1% |
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Lens Material |
Unlimited |
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Curvity |
Curvity Accuracy |
0.1‰ |
0.2‰ |
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Repeatability Accuracy |
0.01‰ |
0.02‰ |
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Surface Shape |
PV，nm |
150 |
300 |
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RMS，nm |
40 |
100 |
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Image |
Image Acquisition System |
ATIAS |
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Maximum Collection Pixels |
130W |
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Minimum Acquisition Time |
3s |
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Image Processing System |
ATIMP-V1.1 |
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Fastest Processing Time |
2s |
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Data |
Specification Judgment |
□ |
□ |
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Yield Statistics |
□ |
□ |
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Real time Statistics And Display Of Good Yield |
□ |
□ |
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Automatic Data Storage |
□ |
□ |
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On-line Inspection |
Automatic Access System |
□ |
□ |
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Data Interface |
□ |
□ |
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Environmental Science |
Temperature |
10℃-40℃ |
10℃-40℃ |
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Humidity |
10%-80% |
10%-80% |
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● To configure □Optional |
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